Aehr Test : Company Presentation (FY26 Investor Presentation June 3 2025)

Published: 2025-06-04 04:55:04 ET AEHR

Published on 06/04/2025 at 04:55

Gayn Erickson

CEO, Aehr Test Systems

Semiconductor Test & Burn-in for over 45 Years!

XP

World-wide leader in wafer-level test and burn-in systems

Unique full-wafer test and burn-in systems and contactors

CP

Technology leader in massively parallel and high-power test and burn-in systems

Time

Production Burn-in: semiconductor components are subjected to elevated voltages and temperatures for a duration of time (2 - 48 hours) to screen for reliability and early failure in production before shipping to customers

Reliability Qualification Burn-in: semiconductor components subjected to elevated voltage and temperatures for 1000 hours to validate and meet industry standards for long term reliability via High Temperature Operating Life (HTOL) tests

Decreasing Failure Rate

Hours, Days, or

Months

Years or

Decades

Months or Years

Increasing Failure Rate

Constant Failure Rate

Wear-Out

Failures

Early "Infant

Mortality" Failure

Failure Rate

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Production Screening / Burn-in

Reliability Qualification / Burn-in

Disclaimer

Aehr Test Systems published this content on June 04, 2025, and is solely responsible for the information contained herein. Distributed via Public Technologies (PUBT), unedited and unaltered, on June 04, 2025 at 08:54 UTC.